Ray Hill

John A. Notte

Larry Scipioni

Advances in Imaging and Electron Physics

ADVANCES IN IMAGING & ELECTRON PHYSICS 合并了两个长期运行的系列——ADVANCES IN ELECTRONICS & ELECTRON PHYSICS 和 ADVANCES IN OPTICAL & ELECTRON MICROSCOPY。该系列包含有关电子器件（尤其是半导体器件）物理、高能和低能粒子光学、微光刻、图像科学和数字图像处理、电磁波传播、电子显微镜以及所有这些领域中使用的计算方法的扩展文章.

Advances in Imaging and Electron Physics combines two long-running series: Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. This series features in-depth articles on the physics of electronic devices (especially semiconductor devices), high-energy and low-energy particle optics, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and computational methods used in all these fields.

《Advances in Imaging and Electron Physics》合并了两个长期运行的系列——《Advances in Electronics & Electron Physics》和《Advances in Optical & Electron Microscopy》。该系列包含关于电子器件（特别是半导体器件）物理、高能和低能粒子光学、微光刻、图像科学和数字图像处理、电磁波传播、电子显微镜以及这些领域中使用的计算方法的深入文章。

Scanning Helium Ion Microscopy

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