Abstract A program for quantitative evaluation of x‐ray photoelectron spectra has been developed to serve as a practical tool for surface chemists. The program uses the ‘classic’ approach of quantification and requires as input the integrated intensities of the measured XPS lines. The usual correction methods and factors can be applied and controlled independently. All necessary basic data for calculations are integrated into the main library of the program. Besides the usual ‘infinitely thick homogeneous sample’ geometry model, the program is able to calculate models for layered structures, both on flat and curved surfaces. Calculation for several samples or experimental data sets can be done together. Results can be presented in several forms, such as atomic %, atomic ratio, oxide molar ratio, etc., and can be stored, printed and charted. Data can be labelled and annotated. XPS MultiQuant is equipped with a user‐friendly interface, full text help system and a ‘wizard’ for easy set‐up of calculations. Copyright © 2004 John Wiley &amp; Sons, Ltd.

M. Mohai

Surface and Interface Analysis

表面和界面分析致力于发表有关表面、界面和薄膜表征技术的开发和应用的论文。处理标准化和量化的论文特别受欢迎，也欢迎那些处理将这些技术应用于工业问题的论文。也将考虑处理该技术的纯理论方面的论文。将发表评论文章；在这些情况下，建议事先咨询其中一位编辑。论文必须明确具有该领域的科学价值，并将提交给两名独立的审稿人。投稿必须是英文，并且不得在其他地方发表，并且作者必须同意不将相同的材料传达给任何其他期刊。邀请作者将他们的论文提交给 JOHN WATTS（仅限英国）、JOSE SANZ（欧洲其他地区）、JOHN T. GRANT（除日本外的所有非欧洲国家）或 R. SHIMIZU（仅限日本）。

Surface and Interface Analysis is dedicated to publishing research papers on the development and application of techniques for the characterization of surfaces, interfaces, and thin films. Papers that address standardization and quantification are particularly welcome, as are those that apply these techniques to industrial problems. Purely theoretical papers will also be considered. The journal will accept review articles, and it is advisable to consult with an editor prior to submission. All submitted papers must clearly demonstrate scientific value and will be reviewed by two independent reviewers. Submissions must be in English and must not be published elsewhere; authors must agree not to submit the same material to any other journal. We invite authors to submit their papers to the following editors: JOHN WATTS (UK only), JOSE SANZ (other parts of Europe), JOHN T. GRANT (all non-European countries except Japan), or R. SHIMIZU (Japan only).

《Surface and Interface Analysis》致力于发表关于表面、界面和薄膜表征技术的开发与应用的研究论文。特别欢迎那些涉及标准化和量化的研究，同时也鼓励将这些技术应用于工业问题的论文。纯理论方面的研究同样会被考虑。期刊将接受评论文章，建议在提交前与编辑进行咨询。所有提交的论文必须明确具有科学价值，并将由两名独立审稿人进行评审。投稿必须使用英文，且不得在其他地方发表，作者需同意不将相同的材料提交给其他期刊。我们邀请作者将论文提交给以下编辑：JOHN WATTS（仅限英国）、JOSE SANZ（欧洲其他地区）、JOHN T. GRANT（除日本外的所有非欧洲国家）或 R. SHIMIZU（仅限日本）。

Category	Quartile
化学	4
化学, 物理化学	4

XPS MultiQuant: multimodel XPS quantification software

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Category	Quartile
CHEMISTRY, PHYSICAL	4