IEEE European Test Symposium (ETS)
Keynote 2 - Sustainability and the Outlook of Semiconductor Industry.
主题演讲2 - 可持续发展与半导体行业展望。
2024
Test and Repair Improvements for UCIe.
UCIe测试与修复改进。
2024
Cross-Layer Reliability Analysis of NVDLA Accelerators: Exploring the Configuration Space.
NVDLA加速器的跨层可靠性分析:探索配置空间。
2024
A SystemC-AMS Development Framework for High Power IC Test-Hardware.
高功率集成电路测试硬件的SystemC-AMS开发框架。
2024
Approximate Fault-Tolerant Neural Network Systems.
近似容错神经网络系统。
2024
AdAM: Adaptive Fault-Tolerant Approximate Multiplier for Edge DNN Accelerators.
AdAM:面向边缘DNN加速器的自适应容错近似乘法器
2024
IEEE 1838 compliant scan encryption and integrity for 2.5/3D ICs.
符合IEEE 1838标准的2.5/3D集成电路扫描加密与完整性。
2024
On-chip Built-In Self-Calibration of Thermal Variations for Mixed-Signal In-Memory Computing.
片上内置自校准技术用于混合信号存内计算中的热变化
2024
Silent Data Corruption from Timing Marginalities Due to Process Variations.
由于工艺变化导致的时序边缘引起的静默数据损坏。
2024
Training Large Language Models for System-Level Test Program Generation Targeting Non-functional Properties.
面向非功能属性的大型语言模型系统级测试程序生成训练。
2024
会议信息
会议名称:
IEEE European Test Symposium
会议评级
CCF: C
CORE: N
THCPL: N
年度会议
Year: 2024
Place: The Hague, Netherlands
Date: May 20-24, 2024
Timeline:
Abstract Deadline: 2023-12-08T23:59:59-12:00
Deadline: 2023-12-16T23:59:59-12:00