IEEE European Test Symposium (ETS)

Keynote 2 - Sustainability and the Outlook of Semiconductor Industry.

主题演讲2 - 可持续发展与半导体行业展望。

2024

Test and Repair Improvements for UCIe.

UCIe测试与修复改进。

2024

Cross-Layer Reliability Analysis of NVDLA Accelerators: Exploring the Configuration Space.

NVDLA加速器的跨层可靠性分析:探索配置空间。

2024

A SystemC-AMS Development Framework for High Power IC Test-Hardware.

高功率集成电路测试硬件的SystemC-AMS开发框架。

2024

Approximate Fault-Tolerant Neural Network Systems.

近似容错神经网络系统。

2024

AdAM: Adaptive Fault-Tolerant Approximate Multiplier for Edge DNN Accelerators.

AdAM:面向边缘DNN加速器的自适应容错近似乘法器

2024

IEEE 1838 compliant scan encryption and integrity for 2.5/3D ICs.

符合IEEE 1838标准的2.5/3D集成电路扫描加密与完整性。

2024

On-chip Built-In Self-Calibration of Thermal Variations for Mixed-Signal In-Memory Computing.

片上内置自校准技术用于混合信号存内计算中的热变化

2024

Silent Data Corruption from Timing Marginalities Due to Process Variations.

由于工艺变化导致的时序边缘引起的静默数据损坏。

2024

Training Large Language Models for System-Level Test Program Generation Targeting Non-functional Properties.

面向非功能属性的大型语言模型系统级测试程序生成训练。

2024

会议信息

会议名称:

IEEE European Test Symposium

会议评级

CCF: C

CORE: N

THCPL: N

年度会议

Year: 2024

Place: The Hague, Netherlands

Date: May 20-24, 2024

Timeline:

Abstract Deadline: 2023-12-08T23:59:59-12:00

Deadline: 2023-12-16T23:59:59-12:00

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