Deep learning‐assisted and combined attack: a novel side‐channel attack

W. Yu, J. Chen

DOI: 10.1049/el.2018.5411

Journal: Electronics Letters

A deep learning (DL)-assisted and combined side-channel attack (SCA) is exploited to disclose the secret key of an advanced encryption standard (AES) cryptographic circuit with a countermeasure.

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Journal Info

Journals:

ISSN 0013-5194

Quartile

CategoryQuartile
ENGINEERING, ELECTRICAL & ELECTRONIC4

Quartile(CN)

CategoryQuartile
工程技术4
工程技术, 工程电子与电气4
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