Deep Learning Techniques for OFDM Systems

M. Meenalakshmi, Saurabh Chaturvedi, Vivek K. Dwivedi

DOI: 10.1080/03772063.2021.1986154

Journal: IETE Journal of Research

A detailed review of recent developments in DL techniques for OFDM systems to improve its performance in terms of bit error rate, signal-to-noise ratio, and PAPR is presented.

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Journal Info

Journals:

ISSN 0377-2063

Quartile

CategoryQuartile
TELECOMMUNICATIONS4

Quartile(CN)

CategoryQuartile
计算机科学4
计算机科学, 工程电子与电气4
计算机科学, 电信学4
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