ABSTRACT In x‐ray fluorescence analysis (XRFA), the use of secondary targets to suppress measurement background is a common practice aimed at reducing detection limits. However, conventional polarized secondary targets often exhibit low conversion efficiency of primary x‐rays. In this paper, we propose a novel hemispherical secondary target designed to exploit a focusing‐like phenomenon for primary x‐rays, thereby enhancing the conversion efficiency and achieving improved background suppression. The optimal dimensions of the hemispherical secondary target are determined through theoretical calculations, and further validated through Monte Carlo simulations and experimental analysis. Our findings reveal a substantial enhancement in the peak‐to‐background ratio when compared to traditional polarized secondary targets. Specifically, for a 1000‐ppm Ce sample, the peak‐to‐background ratio increased from 8.45 to 9.78 with the implementation of the hemispherical secondary target. Similar improvements were observed when measuring a 1000‐ppm Ce sample, relative to direct excitation. Furthermore, the relative error between the system and the ICP‐MS measurement results of the rare earth sample remains within 5%, underscoring the effectiveness of the hemispherical secondary target in XRFA applications.

Yonghong Ma

Weicheng Li

Hui Li

Yuanhui Li

Feng Cheng

Yi Gu

Jian Zhang

Hongfei Xiao

X-Ray Spectrometry

X-RAY SPECTROMETRY 致力于使用电子、X 射线光子、质子、Γ 和 Γ-X 源快速发表有关 X 射线光谱学理论和应用的论文。成熟的期刊为讨论更复杂的 X 射线分析方法提供了理想的平台。波长和能量色散系统与一系列数据处理方法一起涵盖，从最简单到非常复杂的软件程序。还展示了有关将 X 射线光谱法应用于结构分析的论文以及涵盖广泛领域的应用论文，例如环境分析和监测、艺术和考古研究、矿物学、法医学、地质学、表面科学和材料分析、生物医学和制药应用。

X-Ray Spectrometry is dedicated to the rapid publication of research papers on the theory and application of X-ray spectroscopy, utilizing electrons, X-ray photons, protons, Γ, and Γ-X sources. This established journal provides an ideal platform for discussing more complex X-ray analytical methods, covering wavelength and energy dispersive systems along with a range of data processing methods, from the simplest to highly complex software programs. It also showcases papers on the application of X-ray spectroscopy to structural analysis, as well as application papers covering a wide range of fields such as environmental analysis and monitoring, art and archaeological studies, mineralogy, forensic science, geology, surface science, materials analysis, biomedical, and pharmaceutical applications.

《X-Ray Spectrometry》致力于快速发表关于X射线光谱学理论和应用的研究论文，涵盖电子、X射线光子、质子、Γ和Γ-X源的使用。该期刊为讨论更复杂的X射线分析方法提供了理想的平台，涉及从简单到复杂的波长和能量色散系统，以及多种数据处理方法。期刊还展示了将X射线光谱法应用于结构分析的研究，以及在环境分析与监测、艺术与考古研究、矿物学、法医学、地质学、表面科学、材料分析、生物医学和制药等广泛领域的应用论文。

Category	Quartile
物理与天体物理	4
物理与天体物理, 光谱学	4

Design and Application of a Hemispherical XRF Secondary Target

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