Characterizing 3D Floating Gate NAND Flash

Qin Xiong, Fei Wu, Zhonghai Lu, Yue Zhu, You Zhou, Yibing Chu, Changsheng Xie, Ping Huang

DOI: 10.1145/3162616

Journal: ACM Transactions on Storage

This article presents a characterization study on the state-of-the-art 3D floating gate (FG) NAND flash memory through comprehensive experiments on an FPGA-based 3D NAND flash evaluation platform and makes distinct observations on its performance and reliability.

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Journal Info

Journals:

ISSN 1553-3077

Quartile

CategoryQuartile
COMPUTER SCIENCE, SOFTWARE ENGINEERING2

Quartile(CN)

CategoryQuartile
计算机科学3
计算机科学, 计算机硬件3
计算机科学, 计算机软件工程3
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