Study of structural properties of Ta2O5 deposited films using atomistic modeling
Fedor Grigoriev, Vladimir Sulimov, Danil Kutov, Alexander Tikhonravov
DOI: 10.1364/ao.546113
Journal: Applied Optics
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Journal Info
Journals:
ISSN 1559-128X
Quartile
Category | Quartile |
OPTICS | 3 |
Quartile(CN)
Category | Quartile |
工程技术 | 4 |
工程技术, 光学 | 4 |