Study of structural properties of Ta2O5 deposited films using atomistic modeling

Fedor Grigoriev, Vladimir Sulimov, Danil Kutov, Alexander Tikhonravov

DOI: 10.1364/ao.546113

Journal: Applied Optics

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Journal Info

Journals:

ISSN 1559-128X

Quartile

CategoryQuartile
OPTICS3

Quartile(CN)

CategoryQuartile
工程技术4
工程技术, 光学4
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