Computer-Vision-Based Product Quality Inspection and Novel Counting System

Changhyun Lee, Yunsik Kim, Hunkee Kim

DOI: 10.3390/asi7060127

Journal: Applied System Innovation

ivySCI AI Smartly Parses PDF, Answers Researchers' Questions, and Helps You Understand Papers in Seconds

Download ivySCI

Journal Info

Journals:

ISSN 2571-5577

Quartile

CategoryQuartile
TELECOMMUNICATIONS2
Built withby Ivy Science