IEEE Design and Test
| 短名 | IEEE Des. Test |
| Journal Impact | 1.75 |
| 国际分区 | ENGINEERING, ELECTRICAL & ELECTRONIC(Q3) |
| 期刊索引 | SCI Q3中科院 4 区 |
| ISSN | 2168-2356, 2168-2364 |
| h-index | 85 |
| 国内分区 | 工程技术(4区)工程技术计算机硬件(4区)工程技术工程电子与电气(4区) |
IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.
期刊主页| 涉及主题 | 计算机科学工程类物理操作系统嵌入式系统电气工程数学生物量子力学地质学机械工程程序设计语言 |
| 出版信息 | 出版商: IEEE Computer Society，出版周期: ，期刊类型: journal |
| 基本数据 | 创刊年份: 2013，原创研究文献占比: 100.00%，自引率:0.00%， Gold OA占比: 6.08% |
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